A New Specimen Preparation Method for Three-Dimensional Atom Probe
نویسندگان
چکیده
منابع مشابه
Progress of Three-dimensional Atom Probe Techniques for Analysis of Steel Materials —Development of Atom Probe Specimen Preparation Techniques for Site-specific Regions—
Three-dimensional atom probe (3DAP) is a very powerful tool which can investigate atomic positions of all alloying elements in steel with lattice-spacing spatial resolution. However, the very small analysis volume of 3DAP has limited its application field. To meet the needs for atomic-scale analyses of steel materials, advanced preparation techniques of a needle specimen tip including a site-sp...
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Atom-probe tomography (APT) is a quantitative technique that permits three-dimensional (3-D) spectroscopic characterization of interfaces and other nanometer-scale features within a material. Specimens for atom-probe tomography (APT) analysis of semiconductor devices and nanostructured materials are typically fabricated employing a focused ion beam (FIB) instrument [1 3] or a dual-beam FIB inst...
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A new method for the calibration of three-dimensional atom-probe ~3DAP! microscopy mass spectra has been developed. This method is based on a linear regression procedure that takes full advantage of the large number of data points collected during a typical 3DAP analysis. The data analysis procedures involved in the method are direct, relying only on simple scripting routines written in a sprea...
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Atom-probe tomography (APT) provides atomic-scale spatial and compositional resolution that is ideally suited for the analysis of grain boundaries. The small sample volume analyzed in APT presents, however, a challenge for capturing mesoscale features, such as grain boundaries. A new site-specific method utilizing transmission electron microscopy (TEM) for the precise selection and isolation of...
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The best calculation of concentration profiles, isoconcentration surfaces or Gibbsian interfacial excesses from three-dimensional atom-probe microscopy data requires a compromise between spatial positioning error and statistical sampling error. For example, sampling from larger spatial regions decreases the statistical error, but increases the error in spatial positioning. Finding the appropria...
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ژورنال
عنوان ژورنال: e-Journal of Surface Science and Nanotechnology
سال: 2010
ISSN: 1348-0391
DOI: 10.1380/ejssnt.2010.141